4.7 Article

Characterization of copper SERS-active substrates prepared by electrochemical deposition

期刊

APPLIED SURFACE SCIENCE
卷 255, 期 18, 页码 7864-7870

出版社

ELSEVIER
DOI: 10.1016/j.apsusc.2009.04.152

关键词

Surface Enhanced Raman Scattering (SERS); Atomic Force Microscopy (AFM); Scanning Electron Microscopy (SEM); Copper; Electrochemical deposition

资金

  1. Grant Agency of the Czech Republic [GD 104/08/H055]
  2. Grant Agency of the Czech Academy of Science [KAN 208240651]
  3. Ministry of Education, Youth and Sports of the Czech Republic [MSM 6046137307, MSM 604617306]
  4. Department of Research and Development of the Institute of Chemical Technology Prague [402080016]

向作者/读者索取更多资源

Surface Enhanced Raman Scattering (SERS) on copper substrates of various morphologies, prepared by electrochemical deposition on platinum targets, was investigated. The substrate preparation procedures differed by the coating bath compositions, applied current densities and the duration of individual steps. The surface morphology of the substrates was visualized by means of Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM). SERS spectra of selected organic thiols were measured and the relation between SERS spectral intensity and the surface structure of SERS-active substrates was studied. It has been shown that good Raman surface enhancement can be achieved on the copper substrates prepared by electrochemical deposition from ammoniac baths. Copper substrates fabricated from acidic baths did not show efficient Raman surface enhancement. The results of microscopic measurements demonstrated that the average surface roughness value does not play a substantial role, whereas the shape of the surface nanostructures is a key parameter. (C) 2009 Elsevier B. V. All rights reserved.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.7
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据