期刊
APPLIED SURFACE SCIENCE
卷 255, 期 20, 页码 8643-8647出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.apsusc.2009.06.040
关键词
Photoluminescence; Zinc oxide; X-ray diffraction; Magnesium; Oxides
类别
资金
- National Science Council of Taiwan [97-2628-M-018-001-MY3]
Co0.2AlxZn0.8-xO films prepared with different molar ratio of aluminum nitrate to zinc acetate were deposited on substrates by the sol-gel technique. X-ray diffraction, photoluminescence and ferromagnetism measurements were used to characterize the Co0.2AlxZn0.8-xO diluted magnetic semiconductors. The authors found that the intensity of the acceptor-related photoluminescence increased with increasing aluminum concentration and an increase in the number of the acceptor-like defects (zinc vacancies especially) in the Co0.2AlxZn0.8-xO film might lead to the enhancement of the magnetic properties. This implies that controls of the aluminum concentration and the number of the acceptor-like defects are important factors to produce strong ferromagnetism Co0.2AlxZn0.8-xO films prepared by the sol-gel method. (C) 2009 Elsevier B. V. All rights reserved.
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