A two-dimensional photonic crystal semiconductor microcavity with a quality factor Qsimilar to40,000 and a modal volume V(eff)similar to0.9 cubic wavelengths is demonstrated. A micron-scale optical fiber taper is used as a means to probe both the spectral and spatial properties of the cavity modes, allowing not only measurement of modal loss, but also the ability to ascertain the in-plane localization of the cavity modes. This simultaneous demonstration of high-Q and ultrasmall V-eff in an optical microcavity is of potential interest in nonlinear optics, optoelectronics, and quantum optics, where the measured Q and V-eff values could enable strong coupling to both atomic and quantum dot systems.
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