Structure analysis of nanowires and nanobelts by transmission electron microscopy

One-dimensional (ID) nanostructures, such as nanowires, nanobelts, and nanorods, are attracting a great deal of research interest due to their unique properties and novel applications. Structure analysis of ID nanostructures is an essential part of research because achieving structural control is the key step in controlling properties and device performances. Using ZnO, CdSe, and ZnS as examples, this work addresses the technical details of how to use transmission electron microscopy to correctly analyze the structure of nanowires and nanobelts, including growth direction, side/top surfaces, surface polar direction, surface reconstruction, point defects, dislocations, planar defects, and twin[bicrystal structures. The methodologies introduced can be applied to a wide range of ID nanostructures.