Unlimited acquisition time in electron holography by automated feedback control of transmission electron microscope

The signal-to-noise ratio of measurements by electron holography could be considerably improved if longer exposure times were possible: increasing the number of electrons contributing to the hologram improves the counting statistics. However, instrumental instabilities causing drift in the hologram fringes and specimen position make acquisition times of above a few seconds counterproductive. The current approach is to acquire image stacks of holograms, with short exposure times, followed by numerical realignment through sophisticated post-processing. The associated data storage and manipulation make in-situ and tomography experiments extremely cumbersome. Here, we implement dynamic automation of electron holography experiments to overcome these problems. The real-time drift measurement and feedback control of the instrument allow single holograms to be acquired with exposure times of 30 min or more. Indeed, there are no longer any limitations from instrumental instabilities and only those imposed by the specimen itself. Furthermore, automation allows the implementation of sophisticated phase reconstruction techniques based on precise control of the experimental conditions. Smart acquisition of electron holograms preludes future computer-controlled electron microscopy capabilities. Published by AIP Publishing.