期刊
APPLIED PHYSICS LETTERS
卷 105, 期 20, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.4901836
关键词
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资金
- Ministry of Science and Technology of the Republic of China [NSC 102-2112-M-003-002-MY3]
Spectroscopic ellipsometry was used to characterize the complex refractive index of chemical-vapor-deposited monolayer transition metal dichalcogenides (TMDs). The extraordinary large value of the refractive index in the visible frequency range is obtained. The absorption response shows a strong correlation between the magnitude of the exciton binding energy and band gap energy. Together with the observed giant spin-orbit splitting, these findings advance the fundamental understanding of their novel electronic structures and the development of monolayer TMDs-based optoelectronic and spintronic devices. (C) 2014 AIP Publishing LLC.
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