期刊
SURFACE SCIENCE
卷 566, 期 -, 页码 332-336出版社
ELSEVIER
DOI: 10.1016/j.susc.2004.05.064
关键词
atomic force microscopy; electron microscopy; surface structure, morphology, roughness and topography; alloys; clusters; X-ray absorption spectroscopy; magnetic phenomena (cyclotron resonance, phase transitions, etc.)
Mass filtered FeCo clusters with diameters in the order of magnitude of 12 nm were prepared in a new developed, continuously working cluster source and deposited on a Si surface. The AFM measurements exhibit a height being smaller than the diameter for free particles which can be explained by particle-support interaction. Larger clusters are due to the mass selecting process in an electrostatic quadrupole which separates with different m/e ratios. Magnetic properties were determined by X-ray magnetic circular dichroism (XMCD) with elemental specification. (C) 2004 Elsevier B.V. All rights reserved.
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