期刊
APPLIED PHYSICS LETTERS
卷 85, 期 13, 页码 2610-2612出版社
AMER INST PHYSICS
DOI: 10.1063/1.1797539
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The effects of the cantilever on electrostatic force microscopy are discussed. Numerical calculations of the electrostatic potential distribution and force gradient for typical experimental geometries are presented. A simple analytical relation between the calculated force gradients with and without cantilever is found. The main effect of the cantilever is to reduce the electric field in the tip-sample gap and, as a consequence, the force gradient can be strongly reduced. This effect can be very important for dielectric films while it can be neglected for metallic samples. (C) American Institute of Physics.
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