期刊
APPLIED PHYSICS LETTERS
卷 85, 期 13, 页码 2538-2540出版社
AMER INST PHYSICS
DOI: 10.1063/1.1795979
关键词
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Single-electron tunneling events between a metal probe and an insulator surface are measured by frequency detection electrostatic force microscopy. Single-electron tunneling events typically cause 1-10 Hz shifts in the 300 kHz resonance frequency of the oscillating force probe. The frequency shifts appear only within a sub-2 nm tip-sample gap and their magnitude is roughly uniform under fixed experimental conditions. An electrostatic model of the probe-sample system yields results consistent with the measurements. (C) American Institute of Physics.
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