4.6 Article

Epitaxial growth of VO2 by periodic annealing

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APPLIED PHYSICS LETTERS
卷 104, 期 6, 页码 -

出版社

AMER INST PHYSICS
DOI: 10.1063/1.4864404

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资金

  1. ONR [N00014-11-1-0665]
  2. National Science Foundation through the MRSEC program (Cornell Center for Materials Research) [DMR-1120296]
  3. National Science Foundation Materials Research Science and Engineering Centers (MRSEC) program [DMR 1120296]
  4. NSF [IMR-0417392]
  5. Army Research Office
  6. National Science Foundation [ECCS-0335765]
  7. Direct For Mathematical & Physical Scien
  8. Division Of Materials Research [1063059] Funding Source: National Science Foundation

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We report the growth of ultrathin VO2 films on rutile TiO2 (001) substrates via reactive molecular-beam epitaxy. The films were formed by the cyclical deposition of amorphous vanadium and its subsequent oxidation and transformation to VO2 via solid-phase epitaxy. Significant metal-insulator transitions were observed in films as thin as 2.3 nm, where a resistance change Delta R/R of 25 was measured. Low angle annular dark field scanning transmission electron microscopy was used in conjunction with electron energy loss spectroscopy to study the film/substrate interface and revealed the vanadium to be tetravalent and the titanium interdiffusion to be limited to 1.6 nm. (C) 2014 AIP Publishing LLC.

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