4.6 Article

Latch-up based bidirectional npn selector for bipolar resistance-change memory

期刊

APPLIED PHYSICS LETTERS
卷 103, 期 3, 页码 -

出版社

AMER INST PHYSICS
DOI: 10.1063/1.4813832

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资金

  1. Kookmin University in Korea
  2. National Research Foundation of Korea (NRF) [2011-0030228, 2012-0000147]
  3. Ministry of Education, Science and Technology [CISS-2012M3A6A6054187]
  4. Center for Integrated Smart Sensors
  5. Samsung Electronics Company, Ltd.
  6. SK Hynix Semiconductor Inc.

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A vertically integrated latch-up based n-p-n bidirectional diode, which is analogous to an open-base bipolar junction transistor, is demonstrated for bipolar resistance-change memory selector application. A maximum current density of >50 MA/cm(2) and a selectivity of >10(4) are observed at a fast switching speed of within 10 ns. The high selectivity as a consequence of the sudden latch-up process is feasible owing to the positive-feedback process initiated by impact ionization. The optimization of the turn-on voltage is comprehensively investigated by numerical device simulation, which ensures the promising potential of the latch-up based selector device. (C) 2013 AIP Publishing LLC.

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