We examine voids in silica glasses with different fictive temperatures using positron annihilation lifetime spectroscopy. The pick-off annihilation lifetime of ortho-positronium increases with the fictive temperature, T-f, indicating that the void size increases. High T-f leads to high density and low degree of network polymerization so that increasing void size means that the density fluctuation of the silica glass increases with high T-f. Assuming that such density fluctuation causes light scattering, the previously reported T-f dependence of the Rayleigh scattering coefficient can be well explained by the change in void size. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4761982]
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