期刊
APPLIED PHYSICS LETTERS
卷 100, 期 15, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.3701598
关键词
-
资金
- U.K. Engineering and Physical Sciences Research Council (EPSRC)
Using aberration-corrected scanning transmission electron microscope and energy dispersive x-ray spectroscopy, single, isolated impurity atoms of silicon and platinum in monolayer and multilayer graphene are identified. Simultaneously acquired electron energy loss spectra confirm the elemental identification. Contamination difficulties are overcome by employing near-UHV sample conditions. Signal intensities agree within a factor of two with standardless estimates. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.3701598]
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据