相关参考文献
注意:仅列出部分参考文献,下载原文获取全部文献信息。Investigation on the characteristics of stress-induced hump in amorphous oxide thin film transistors
Jang Hyun Kim et al.
APPLIED PHYSICS LETTERS (2011)
Investigating the degradation behavior caused by charge trapping effect under DC and AC gate-bias stress for InGaZnO thin film transistor
Te-Chih Chen et al.
APPLIED PHYSICS LETTERS (2011)
Transition of dominant instability mechanism depending on negative gate bias under illumination in amorphous In-Ga-Zn-O thin film transistor
Himchan Oh et al.
APPLIED PHYSICS LETTERS (2011)
Water-related abnormal instability of transparent oxide/organic hybrid thin film transistors
Shinhyuk Yang et al.
APPLIED PHYSICS LETTERS (2011)
Gate bias-stress induced hump-effect in transfer characteristics of amorphous-indium-galium-zinc-oxide thin-fim transistors with various channel widths
Mallory Mativenga et al.
APPLIED PHYSICS LETTERS (2011)
Transparent Flexible Circuits Based on Amorphous-Indium-Gallium-Zinc-Oxide Thin-Film Transistors
Mallory Mativenga et al.
IEEE ELECTRON DEVICE LETTERS (2011)
The Effect of Active-Layer Thickness and Back-Channel Conductivity on the Subthreshold Transfer Characteristics of Hf-In-Zn-O TFTs
W. J. Maeng et al.
IEEE ELECTRON DEVICE LETTERS (2011)
The Impact of Passivation Layers on the Negative Bias Temperature Illumination Instability of Ha-In-Zn-O TFT
Sun-Il Kim et al.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY (2011)
The status and perspectives of metal oxide thin-film transistors for active matrix flexible displays
Jae Kyeong Jeong
SEMICONDUCTOR SCIENCE AND TECHNOLOGY (2011)
Behaviors of InGaZnO thin film transistor under illuminated positive gate-bias stress
Te-Chih Chen et al.
APPLIED PHYSICS LETTERS (2010)
Analysis of Hump Characteristics in Thin-Film Transistors With ZnO Channels Deposited by Sputtering at Various Oxygen Partial Pressures
Mamoru Furuta et al.
IEEE ELECTRON DEVICE LETTERS (2010)
Reliable Bottom Gate Amorphous Indium-Gallium-Zinc Oxide Thin-Film Transistors with TiOx Passivation Layer
Hyun-Sik Seo et al.
ELECTROCHEMICAL AND SOLID STATE LETTERS (2009)
Self-Heating of Laterally Grown Polycrystalline Silicon Thin-Film Transistor
Kazunori Watanabe et al.
JAPANESE JOURNAL OF APPLIED PHYSICS (2009)
Temperature-Dependent Transfer Characteristics of Amorphous InGaZnO4 Thin-Film Transistors
Kazushige Takechi et al.
JAPANESE JOURNAL OF APPLIED PHYSICS (2009)
Bias-stress-induced stretched-exponential time dependence of threshold voltage shift in InGaZnO thin film transistors
Jeong-Min Lee et al.
APPLIED PHYSICS LETTERS (2008)
Thermal Analysis of Degradation in Ga2O3-In2O3-ZnO Thin-Film Transistors
Mami Fujii et al.
JAPANESE JOURNAL OF APPLIED PHYSICS (2008)
Suppression of self-heating in low-temperature polycrystalline silicon thin-film transitors
Shinichiro Hashimoto et al.
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS (2007)
Hot carrier analysis in low-temperature poly-Si TFTs using picosecond emission microscope
Y Uraoka et al.
IEEE TRANSACTIONS ON ELECTRON DEVICES (2004)