期刊
APPLIED PHYSICS LETTERS
卷 85, 期 16, 页码 3555-3557出版社
AMER INST PHYSICS
DOI: 10.1063/1.1807945
关键词
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Thin chromium cantilevers with sub-100 nm thickness have been characterized by an atomic force microscope operating in contact mode. A continuous determination of the local mechanical properties at all lengths was accomplished by applying force along the length of the cantilevers. The result show a decrease of the Young's modulus as the cantilevers get thinner. (C) 2004 American Institute of Physics.
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