4.6 Article

Multiscale element mapping of buried structures by ptychographic x-ray diffraction microscopy using anomalous scattering

期刊

APPLIED PHYSICS LETTERS
卷 99, 期 13, 页码 -

出版社

AMER INST PHYSICS
DOI: 10.1063/1.3644396

关键词

buried layers; electron density; gold; nanofabrication; nanoparticles; silver; X-ray diffraction; X-ray scattering

资金

  1. Ministry of Education, Culture, Sports, Science and Technology
  2. [21686060]
  3. [22651040]
  4. [23102504]
  5. Grants-in-Aid for Scientific Research [21686060, 22651040, 23102504] Funding Source: KAKEN

向作者/读者索取更多资源

We propose an element mapping technique of nano-meso-microscale structures buried within large and/or thick objects by ptychographic x-ray diffraction microscopy using anomalous scattering. We performed quantitative imagings of both the electron density and Au element of Au/Ag nanoparticles at the pixel resolution of better than 10 nm in a field of view larger than 5 x 5 mu m(2) by directly phasing ptychographic coherent diffraction patterns acquired at two x-ray energies below the Au L-3 edge. This method provides us with multiscale structural and elemental information for understanding the element/property relationship linking nanoscale structures to macroscopic functional properties in material and biological systems. (C) 2011 American Institute of Physics. [doi:10.1063/1.3644396]

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