4.6 Article

Terahertz optical-Hall effect characterization of two-dimensional electron gas properties in AlGaN/GaN high electron mobility transistor structures

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APPLIED PHYSICS LETTERS
卷 98, 期 9, 页码 -

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AMER INST PHYSICS
DOI: 10.1063/1.3556617

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资金

  1. Army Research Office [W911NF-09-C-0097]
  2. National Science Foundation [MRSEC DMR-0820521, MRI DMR-0922937, DMR-0907475]
  3. University of Nebraska-Lincoln
  4. J.A. Woollam Foundation
  5. Direct For Mathematical & Physical Scien
  6. Division Of Materials Research [0907475] Funding Source: National Science Foundation

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The free-charge carrier mobility, sheet density, and effective mass of a two-dimensional electron gas are exemplarily determined in the spectral range from 640 GHz to 1 THz in a AlGaN/GaN heterostructure using the optical-Hall effect at room temperature. Complementary midinfrared spectroscopic ellipsometry measurements are performed for analysis of heterostructure constituents layer thickness, phonon mode, and free-charge carrier parameters. The electron effective mass is determined to be (0.22 +/- 0.04)m(0). The high-frequency sheet density and carrier mobility parameters are in good agreement with results from dc electrical Hall effect measurements, indicative for frequency-independent carrier scattering mechanisms of the two-dimensional carrier distribution. (C) 2011 American Institute of Physics. [doi:10.1063/1.3556617]

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