4.6 Article

Atom probe analysis of interfacial abruptness and clustering within a single InxGa1-xN quantum well device on semipolar (10(1)over-bar(1)over-bar) GaN substrate

评价这篇论文

主要评分表示论文的整体质量水平。次要评分独立反映论文的优点或缺点。

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started