4.6 Article

Ultimate photovoltage in perovskite oxide heterostructures with critical film thickness

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APPLIED PHYSICS LETTERS
卷 98, 期 18, 页码 -

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AMER INST PHYSICS
DOI: 10.1063/1.3586250

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  1. National Natural Science Foundation of China
  2. National Basic Research Program of China

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One order larger photovoltage is obtained with critical thicknesses of La0.9Sr0.1MnO3 films in both kinds of heterostructures of La0.9Sr0.1MnO3/SrTiO3 (0.8 wt % Nb-doped) and La0.9Sr0.1MnO3/Si fabricated at various oxygen pressures. Our self-consistent calculation reveals that the critical thickness of the La0.9Sr0.1MnO3 film with the ultimate value of photovoltage is just the thickness of the depletion layer of La0.9Sr0.1MnO3 in both heterojunctions, respectively. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3586250]

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