期刊
APPLIED PHYSICS LETTERS
卷 97, 期 4, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.3467838
关键词
atomic force microscopy; bismuth compounds; electrical conductivity transitions; electrical resistivity; grain boundaries; multiferroics; thin films; vacancies (crystal)
资金
- Chinese Academy of Sciences
- National Natural Science Foundation of China
- State Key Project of Fundamental Research of China (973 Program), Zhejiang
- Ningbo Natural Science Foundations
We report resistance switching effects in polycrystalline pure BiFeO3 films prepared by a sol-gel method. By current-voltage and conductive atomic force microscope (c-AFM) measurements, resistance switching effects are observed in BiFeO3 films annealed at and above 650 degrees C. A fresh sample can be transformed into a low-resistive state by applying a high positive voltage without forming process and then be switched to a high-resistive state by applying a negative voltage. Both c-AFM and retention results suggest that the redistribution of oxygen vacancies in grain boundaries could play a key role on the resistance switching in the polycrystalline pure BiFeO3 films. (C) 2010 American Institute of Physics. [doi:10.1063/1.3467838]
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据