期刊
APPLIED PHYSICS LETTERS
卷 96, 期 5, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.3304167
关键词
circuit reliability; random noise; random-access storage
资金
- EU [FP6-033751]
Resistive-switching memory (RRAM) is attracting a considerable interest for the development of high-density nonvolatile memories. However, several scaling and reliability issues still affect the development path of RRAM. This work addresses random telegraph-signal noise (RTN) of the RRAM current, potentially affecting the memory stability. We show a clear resistance dependence of the RTN amplitude, and we propose a physical model describing the interaction of the localized current with a fluctuating defect. By estimating the diameter of the conductive filament, the model quantitatively accounts for the observed RTN amplitude, thus allowing for an analytical prediction of state stability in RRAMs.
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