期刊
APPLIED PHYSICS LETTERS
卷 97, 期 7, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.3480608
关键词
atomic force microscopy; scanning probe microscopy
资金
- NIH [HG-04431, HG-04549]
- NSF [0328162]
- UIUC Nano CEMMS Center
We demonstrate a technique in microscopy which extends the domain of atomic force microscopy to optical spectroscopy at the nanometer scale. We show that molecular resonance of feature sizes down to the single molecular level can be detected and imaged purely by mechanical detection of the force gradient between the interaction of the optically driven molecular dipole and its mirror image in a platinum coated scanning probe tip. This microscopy and spectroscopy technique is extendable to frequencies ranging from radio to infrared and the ultraviolet. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3480608]
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