期刊
APPLIED PHYSICS LETTERS
卷 96, 期 15, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.3374323
关键词
bismuth compounds; epitaxial layers; lanthanum compounds; lattice constants; Poisson ratio; strontium compounds; X-ray diffraction
资金
- Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. DOE
- Deutsche Forschungsgemeinschaft [FOR520]
We demonstrate using four-circle x-ray diffraction that the piezoelectric substrate of Pb(Mg1/3Nb2/3)(0.72)Ti0.28O3(001) induces uniform reversible in-plane strain to epitaxially-grown oxide films and bilayers. The biaxial in-plane strain depends linearly on the applied electrical voltage. Utilizing the reversible strain, the strain-dependent lattice structure and the Poisson number characterizing the elastic response is determined for 200 nm thick SrTiO3, LaScO3, and BiFeO3 films. The uniformity and reversibility of the strain provides access to the direct quantitative measurement of strain-dependent properties of epitaxial oxide films.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据