期刊
APPLIED PHYSICS LETTERS
卷 96, 期 9, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.3332591
关键词
statistics; X-ray diffraction; X-ray microscopy
资金
- German Ministry of Education and Research (BMBF) [05KS7OD1]
- Impuls-und Vernetzungsfonds (IVF) of the Helmholtz-Society [VI-203]
We have carried out a ptychographic scanning coherent diffraction imaging experiment on a test object in order to characterize the hard x-ray nanobeam in a scanning x-ray microscope. In addition to a high resolution image of the test object, a detailed quantitative picture of the complex wave field in the nanofocus is obtained with high spatial resolution and dynamic range. Both are the result of high statistics due to the large number of diffraction patterns. The method yields a complete description of the focus, is robust against inaccuracies in sample positioning, and requires no particular shape or prior knowledge of the test object.
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