4.6 Article

Nanoscale imaging and control of resistance switching in VO2 at room temperature

期刊

APPLIED PHYSICS LETTERS
卷 96, 期 21, 页码 -

出版社

AMER INST PHYSICS
DOI: 10.1063/1.3435466

关键词

-

资金

  1. Harvard NSEC under NSF [PHY-0117795]
  2. AFOSR [FA9550-08-1-0203]

向作者/读者索取更多资源

We demonstrate controlled local phase switching of a VO2 film using a biased conducting atomic force microscope tip. After application of an initial, higher training voltage, the resistance transition is hysteretic with IV loops converging upon repeated voltage sweep. The threshold V-set to initiate the insulator-to-metal transition is on order similar to 5 V at room temperature, and increases at low temperature. We image large variations in V-set from grain to grain. Our imaging technique opens up the possibility for an understanding of the microscopic mechanism of phase transition in VO2 as well as its potential relevance to solid state devices. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3435466]

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.6
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据