期刊
APPLIED PHYSICS LETTERS
卷 97, 期 18, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.3512870
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资金
- Ministry of Education, Culture, Sports, Science, and Technology of Japan [22015009, 22360271]
- Grants-in-Aid for Scientific Research [22015009, 22360271] Funding Source: KAKEN
To clarify the electronic density of states (DOS) around the conduction band bottom for state of the art transparent amorphous oxide semiconductors (TAOSs), InGaZnO4 and In2MgO4, we fabricated TAOS-based transparent thin film transistors (TTFTs) and measured their gate voltage dependence of thermopower (S). TAOS-based TTFTs exhibit an unusual S behavior. The vertical bar S vertical bar-value abruptly increases but then gradually decreases as V-g increases, clearly suggesting the antiparabolic shaped DOS is hybridized with the original parabolic shaped DOS around the conduction band bottom. (c) 2010 American Institute of Physics. [doi:10.1063/1.3512870]
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