期刊
APPLIED PHYSICS LETTERS
卷 97, 期 11, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.3486117
关键词
copper; copper compounds; giant magnetoresistance; ion beam effects; magnetic thin films; metallic thin films; nanostructured materials; surface treatment; tomography
We have enhanced magnetoresistance (MR) for current-perpendicular-to-plane giant-magnetoresistive (CPP-GMR) films with a current-confined-path nano-oxide layer (CCP-NOL). In order to realize higher purity in Cu for CCPs, hydrogen ion treatment (HIT) was applied as the CuO(x) reduction process. By applying the HIT process, an MR ratio was increased to 27.4% even in the case of using conventional FeCo magnetic layer, from 13.0% for a reference without the HIT process. Atom probe tomography data confirmed oxygen reduction by the HIT process in the CCP-NOL. The relationship between oxygen counts and MR ratio indicates that further oxygen reduction would realize an MR ratio greater than 50%. (c) 2010 American Institute of Physics. [doi:10.1063/1.3486117]
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