期刊
POLYMER
卷 45, 期 24, 页码 8195-8200出版社
ELSEVIER SCI LTD
DOI: 10.1016/j.polymer.2004.09.064
关键词
polymer blends; electric force microscopy; EFM
We report the applicability of Electric Force Microscopy (EFM) for the analysis of thin films of dielectric heterogeneous polymer blends constituted of polymers with both close and significantly different dielectric constants and offer a simple model that enables quantitative analysis of EFM images of such blends. (C) 2004 Elsevier Ltd. All rights reserved.
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