期刊
APPLIED PHYSICS LETTERS
卷 96, 期 15, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.3402767
关键词
semiconductor lasers; terahertz spectroscopy; thickness measurement
We present a tunable multifrequency continuous wave terahertz spectrometer based on two laser diodes, photoconductive antennas, and a coherent detection scheme. The system is employed to determine the absolute thickness of samples utilizing a proposed synthetic difference frequency method to circumvent the 2 pi uncertainty known from conventional photomixing systems while preserving a high spatial resolution.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据