4.6 Article

Correlation of Mn charge state with the electrical resistivity of Mn doped indium tin oxide thin films

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APPLIED PHYSICS LETTERS
卷 97, 期 11, 页码 -

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AMER INST PHYSICS
DOI: 10.1063/1.3481800

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binding energy; bonds (chemical); electrical resistivity; indium compounds; manganese; semiconductor materials; semiconductor thin films

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Correlation of charge state of Mn with the increase in resistivity with Mn concentration is demonstrated in Mn-doped indium tin oxide films. Bonding analysis shows that Mn 2p(3/2) core level can be deconvoluted into three components corresponding to Mn2+ and Mn4+ with binding energies 640.8 eV and 642.7 eV, respectively, and a Mn2+ satellite at similar to 5.4 eV away from the Mn2+ peak. The presence of the satellite peak unambiguously proves that Mn exists in the +2 charge state. The ratio of concentration of Mn2+ to Mn4+ of similar to 4:1 suggests that charge compensation occurs in the n-type films causing the resistivity increase. (c) 2010 American Institute of Physics. [doi:10.1063/1.3481800]

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