期刊
APPLIED PHYSICS LETTERS
卷 96, 期 18, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.3428368
关键词
energy gap; gallium compounds; III-V semiconductors; indium compounds; infrared spectra; molecular beam epitaxial growth; phonon-plasmon interactions; semiconductor thin films; ultraviolet spectra; visible spectra
Low energy optical modes of molecular beam epitaxy-grown In1-xGaxN thin films with 0 < x < 0.6 are investigated using infrared reflectance measurements. We found that the reflectance of the films for wave vectors in the range from 600 to 800 cm(-1) is determined by the high energy E-1(LO)-plasmon coupled modes. In the higher energy regime of the UV-visible reflectance spectrum of InN, critical points with energies 4.75, 5.36, and 6.12 eV belonging to A and B structures are observed. The energies of these critical points increase with increasing values of x, similar to the band gap energy of these films. (C) 2010 American Institute of Physics. [doi:10.1063/1.3428368]
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据