期刊
APPLIED PHYSICS LETTERS
卷 85, 期 22, 页码 5239-5241出版社
AMER INST PHYSICS
DOI: 10.1063/1.1829799
关键词
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In-bulk recording without cracking in borosilicate glass by high repetition rate (80 MHz) 12 ps pulses at 355 nm wavelength is demonstrated and discussed. The theoretical model of a hot-line scan and thermal accumulation qualitatively well describes the experimental results. The analytical expression of a thermally induced stress was obtained. (C) 2004 American Institute of Physics.
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