期刊
APPLIED PHYSICS LETTERS
卷 95, 期 8, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.3210784
关键词
elemental semiconductors; indium compounds; infrared detectors; integrated circuits; nanostructured materials; photodetectors; photoluminescence; semiconductor superlattices; silicon
We report a simple silicon/Si nanocrystal superlattice/indium tin oxide structure as a photodetector, which shows a very high photosensitivity in a wide wavelength range from ultraviolet (UV) to near infrared. The fabrication of this photodetector structure is easily integrated into a standard process of Si microelectronics. The light and dark current versus voltage characteristics and photoluminescence of the photodetector show that the optical down-conversion of UV light by the superlattice layer is the main reason of the enhanced UV response.
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