期刊
APPLIED PHYSICS LETTERS
卷 94, 期 14, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.3115026
关键词
Fresnel diffraction; graphene; multilayers; optical microscopy; visible spectra
资金
- Canadian Institute for Advanced Research, Le Fonds Quebecois
- Nature et les Technologies and the Natural Sciences and Engineering Research Council of Canada [NSERC 342439]
We show that optical reflection microscopy is a reliable method to simultaneously locate and count graphene layers deposited on bulk, transparent substrates such as soda-lime glass. The visible contrast in optical reflection versus graphene layer number is resolvable on bulk substrates. A simple Fresnel theory based on the universal optical conductance of graphene layers accurately models optical reflection images taken at a wavelength of 550 +/- 5 nm. We directly count one to nine layers of graphene using reflection microscopy.
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