期刊
APPLIED PHYSICS LETTERS
卷 94, 期 23, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.3152784
关键词
bismuth compounds; electrodes; ferroelectric capacitors; ferroelectric thin films; leakage currents; permittivity; platinum; pulsed laser deposition; strontium compounds
资金
- Romanian Ministry of Education and Research [PNII-72-149-HETOX]
- German Science Foundation (DFG) [SFB 762]
The leakage current in epitaxial BiFeO3 capacitors with bottom SrRuO3 and top Pt electrodes, grown by pulsed laser deposition on SrTiO3 (100), SrTiO3 (110), and SrTiO3 (111) substrates, is investigated by current-voltage (I-V) measurements in the 100-300 K temperature range. It is found that the leakage current is interface-limited and strongly dependent on the orientation of the substrate. The potential barriers at the electrode interfaces are estimated to about 0.6, 0.77, and 0.93 eV for the (100), (110), and (111) orientations, respectively.
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