期刊
APPLIED PHYSICS LETTERS
卷 94, 期 1, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.3062851
关键词
amorphisation; electron beam effects; focused ion beam technology
资金
- SRC-DARPA Focus Center Research Program (FCRP) through Functional Engineered Nano Architectonics (FENA) Center and Interconnect Focus Center (IFC)
The authors report micro-Raman investigation of changes in the single and bilayer graphene crystal lattice induced by the low and medium energy electron-beam irradiation (5-20 keV). It was found that the radiation exposures result in the appearance of the strong disorder D band around 1345 cm(-1), indicating damage to the lattice. The D and G peak evolution with increasing radiation dose follows the amorphization trajectory, which suggests graphene's transformation to the nanocrystalline and then to amorphous form. The results have important implications for graphene characterization and device fabrication, which rely on the electron microscopy and focused ion beam processing.
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