期刊
APPLIED PHYSICS LETTERS
卷 95, 期 19, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.3265946
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资金
- Ministry of Education, Culture, Sports, and Technology (MEXT) of Japan [19053001]
- PRESTO
- Japan Science and Technology Agency
- New Energy and Industrial Technology Development Organization (NEDO)
- Japan Society for the Promotion of Science (JSPS)
We show that an annular detector placed within the bright field cone in scanning transmission electron microscopy allows direct imaging of light elements in crystals. In contrast to common high angle annular dark field imaging, both light and heavy atom columns are visible simultaneously. In contrast to common bright field imaging, the images are directly and robustly interpretable over a large range of thicknesses. We demonstrate this through systematic simulations and present a simple physical model to obtain some insight into the scattering dynamics (C) 2009 American Institute of Physics. [doi:10.1063/1.3265946]
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