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注意:仅列出部分参考文献,下载原文获取全部文献信息。Electrostatic modification of infrared response in gated structures based on VO2
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Band-selective measurements of electron dynamics in VO2 using femtosecond near-edge x-ray absorption -: art. no. 067405
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Switchable reflectivity on silicon from a composite VO2-SiO2 protecting layer
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