期刊
APPLIED PHYSICS LETTERS
卷 94, 期 3, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.3074374
关键词
copper; internal stresses; multilayers; nanostructured materials; niobium; sputtered coatings; X-ray diffraction
资金
- NNSA's Laboratory Directed Research and Development Program
- U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences [DE-AC02-06CH11357]
- DOE, Office of Science, Office of Basic Energy Sciences
The yield behavior in a freestanding sputter-deposited Cu/Nb multilayer with 30 nm nominal individual layer thickness has been investigated with in situ synchrotron x-ray diffraction during tensile loading. A pronounced elastic-plastic transition is observed with the fraction of plastically yielded grains increasing gradually with strain. Near synchronous yielding is observed in the Cu and Nb grains. The gradual progression in yield behavior is interpreted in terms of residual stresses, and elastic and plastic anisotropy.
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