期刊
ULTRAMICROSCOPY
卷 102, 期 1, 页码 23-26出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.ultramic.2004.08.002
关键词
in situ straining; transmission electron microscopy; focused ion beam
类别
A method has been devised and demonstrated for producing in situ straining specimens for the transmission electron microscope (TEM) from specific locations in a sample using a dual-beam focused ion beam (FIB) instrument. The specimen is removed from a polished surface in the FIB using normal methods and then attached to a pre-fabricated substrate in the form of a modified TEM tensile specimen. In this manner, specific features of the microstructure of a polished optical mount can be selected for in situ tensile straining. With the use of electron backscattered diffraction (EBSD), this technique could be extended to select specific orientations of the specimen as well. (C) 2004 Elsevier B.V. All rights reserved.
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