4.6 Article

Stripe domain structure in epitaxial (001) BiFeO3 thin films on orthorhombic TbScO3 substrate

期刊

APPLIED PHYSICS LETTERS
卷 94, 期 25, 页码 -

出版社

AMER INST PHYSICS
DOI: 10.1063/1.3152009

关键词

bismuth compounds; dielectric polarisation; electric domains; epitaxial layers; ferroelasticity; ferroelectric thin films; nucleation; terbium compounds

资金

  1. Direct For Mathematical & Physical Scien
  2. Division Of Materials Research [820404] Funding Source: National Science Foundation

向作者/读者索取更多资源

We have analyzed the ferroelastic and ferroelectric domain structure of high crystalline quality (001) BiFeO3 films on orthorhombic (110) TbScO3 substrates. Two domains were present in stripes separated by (010) vertical boundaries, with spontaneous polarizations in adjacent domains rotated by 109 degrees. The striped morphology was caused by nucleation of only two ferroelastic domains on the low symmetry GdFeO3-type substrate. Domain engineering through substrate symmetry is an important finding for rhombohedral ferroelectric epitaxial thin films. The stripe pattern with vertical walls may be useful for extracting domain wall contributions to magnetism and electrical transport properties of BiFeO3 materials.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.6
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据