期刊
APPLIED PHYSICS LETTERS
卷 94, 期 1, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.3067998
关键词
ferromagnetic materials; galvanomagnetic effects; II-VI semiconductors; magnetic thin films; magnetisation; nickel; pulsed laser deposition; semiconductor growth; semiconductor thin films; semimagnetic semiconductors; wide band gap semiconductors; X-ray chemical analysis; X-ray diffraction; X-ray photoelectron spectra; zinc compounds
资金
- NSF [DMR-0746486]
Here we report a detailed study aimed on understanding the origin of ferromagnetism in Ni-doped ZnO films. A pulsed laser deposition technique was used to deposit Ni-doped (5 at. %) ZnO films on sapphire (0001) substrates under different oxygen pressures ranging from 10(-6) to 0.1 Torr. Films were characterized using numerous characterization techniques including x-ray diffraction, x-ray photospectroscopy, energy dispersive x-ray spectroscopy, optical absorption spectroscopy, and electrical transport, magnetotransport, and magnetization measurements. A detailed structure-property correlation and analysis of our results revealed that the ferromagnetism in ZnO:Ni films is not an inherent property of the material but results due to a strong tendency of Ni to precipitate out in the ZnO matrix.
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