相关参考文献
注意：仅列出部分参考文献，下载原文获取全部文献信息。Terahertz magneto-optic generalized ellipsometry using synchrotron and blackbody radiation
T. Hofmann et al.
REVIEW OF SCIENTIFIC INSTRUMENTS (2006)
Conduction-band electron effective mass in Zn0.87Mn0.13Se measured by terahertz and far-infrared magnetooptic ellipsometry -: art. no. 042105
T Hofmann et al.
APPLIED PHYSICS LETTERS (2006)
Long-wavelength interface modes in semiconductor layer structures
M Schubert et al.
PHYSICAL REVIEW B (2005)
Terahertz time domain magneto-optical ellipsometry in reflection geometry
Y Ino et al.
PHYSICAL REVIEW B (2004)
Terahertz imaging of silicon wafers
M Herrmann et al.
JOURNAL OF APPLIED PHYSICS (2002)
Measurement of complex optical constants of a highly doped Si wafer using terahertz ellipsometry
T Nagashima et al.
APPLIED PHYSICS LETTERS (2001)
A cross-correlation spectroscopy in subterahertz region using an incoherent light source
O Morikawa et al.
APPLIED PHYSICS LETTERS (2000)
分享论文
