期刊
APPLIED PHYSICS LETTERS
卷 95, 期 14, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.3242418
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资金
- EU [NMP3-CT-2006-032644]
- Engineering and Physical Sciences Research Council [EP/G005001/1] Funding Source: researchfish
- EPSRC [EP/G005001/1] Funding Source: UKRI
A conductive atomic force microscopy (C-AFM) study on a positive temperature coefficient of resistance (ptcr) BaTiO3 thermistor is reported. The method provides imaging of the dielectric properties with a lateral resolution on the nanometer scale. Measurements were carried out in the temperature range of 25-250 degrees C to study the conduction mechanisms below and above the ferroelectric-paraelectric transition at similar to 130 degrees C. The effective thickness of the barrier regions associated with the grain-shell and grain boundaries is similar to 450-550 nm and is similar to 10% of the volume fraction of the grains. The C-AFM results therefore confirm previous impedance spectroscopy studies that show the ptcr-effect to be associated with both the grain boundaries and outer grain-shells of individual grains. (C) 2009 American Institute of Physics. [doi: 10.1063/1.3242418]
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