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Reversible switching characteristics of polyfluorene-derivative single layer film for nonvolatile memory devices

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APPLIED PHYSICS LETTERS
卷 92, 期 25, 页码 -

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AMER INST PHYSICS
DOI: 10.1063/1.2952825

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This letter reports on reversible switching behavior of metal-insulator-metal type nonvolatile organic memory devices using polyfluorene-derivative (WPF-oxy-F) single layer film. The current-voltage (I-V) characteristics showed that the WPF-oxy-F single layer film has two distinguished resistance states, low resistance state and high resistance state, with four orders of on/off ratio (I-on/I-off similar to 10(4)). From the analysis of I-V curves, area dependent I-V characteristics, and current images obtained by conducting atomic force microscopy we propose that the space charge limited current with filamentary conduction is a potential mechanism for the reversible switching behavior of WPF-Oxy-F memory devices. (c) 2008 American Institute of Physics.

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