期刊
APPLIED PHYSICS LETTERS
卷 93, 期 25, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.3040012
关键词
elemental semiconductors; Fourier transform optics; image resolution; integrated optics; near-field scanning optical microscopy; optical waveguides; silicon; silicon-on-insulator; slot lines
Silicon-on-insulator slot waveguides are studied by scanning near-field optical microscopy. Images of the standing wave pattern were established experimentally and compared with numerical simulations. Fourier analysis along the propagation direction reveals noticeable frequencies both on the experiment and the computation that could be related not only to the guided mode but also to beating phenomena between the coupled waveguides. Finally, light confinement above the slot is directly visualized with a subwavelength resolution and is compared with the expected field distribution.
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