Complete mechanical measurements are performed in submicron films using the picosecond ultrasonic technique. The Al layer deposited on the top of the sample acting as a transducer is replaced with a nanostructured Al film. Using an usual picosecond ultrasonic setup we can excite and detect high- frequency longitudinal and surface acoustic waves. From this we can deduce Young's modulus and Poisson's ratio of any isotropic thin film. Experimental results obtained for a thin silica layer on silicon are in very good agreement with literature. (C) 2008 American Institute of Physics.
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