Imaging and alignment of nanoscale 180° stripe domains in ferroelectric thin films

Nanometer-period ferroelectric 180 degrees stripe domains are observed in epitaxial PbTiO(3) films using atomic force microscopy. Stripe domains can be aligned with surface step edges or in preferred crystallographic directions. A stripe alignment map as a function of temperature and film thickness is determined using synchrotron x-ray scattering. Pinning by step edges permits control of stripe domain morphology, as demonstrated by a film grown on a vicinal surface.