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Dedicated Max-Planck beamline for the in situ investigation of interfaces and thin films

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REVIEW OF SCIENTIFIC INSTRUMENTS
卷 75, 期 12, 页码 5302-5307

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AMER INST PHYSICS
DOI: 10.1063/1.1819552

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A dedicated beamline for the Max-Planck-Institut fur Metallforschung was recently taken into operation at the Angstromquelle Karlsruhe (ANKA). Here we describe the layout of the beamline optics and the experimental end-station, consisting of a heavy duty multiple circle diffractometer. For both a new design was realized, combining a maximum flexibility in the beam properties [white, pink, (focused) monochromatic, energy range 6-20 keV] with a special diffractometer for heavy sample environments up to 500 kg, that can be run in different geometrical modes. In addition the angular-reciprocal space transformations for the diffractometer in use are derived, which allows an operation of the instrument in the convenient six circle mode. As an example, results from surface x-ray diffraction on a Cu3Au(111) single crystal are presented. (C) 2004 American Institute of Physics.

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