期刊
APPLIED PHYSICS LETTERS
卷 93, 期 13, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.2992203
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资金
- Korea government (MEST) [R0A-2007-000-20044-0]
Transmission electron microscope images showed that ZnO nanoparticles were formed in a polymethylmethacrylate (PMMA) layer. Current-voltage (I-V) curves for the Al/C-60/ZnO nanoparticles embedded in the PMMA layer/C-60/indium tin oxide (ITO) device at 300 K showed a current bistability with a large on/off ratio of 104, which was much larger than the on/off ratio of the device without C-60 layers, indicative of significant enhancement of memory storage. Carrier transport mechanisms of the memory effects for the Al/C-60/ZnO nanoparticles embedded in the PMMA layer/C-60/ITO device are described on the basis of the I-V results. (C) 2008 American Institute of Physics.
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